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ELECTROCHEMICAL ADSORPTION OF METALS ON AMORPHOUS SE-GE FILMSBHANWAR SINGH; CHOPRA KL.1981; J. APPL. PHYS.; ISSN 0021-8979; USA; DA. 1981; VOL. 52; NO 1; PP. 428-433; BIBL. 33 REF.Article
GENETIC DIVERGENCE AMONG TETRAPLOID TRITICUM SPECIESJOSHI MG; BHANWAR SINGH.1979; INDIAN J. GENET. PLANT BREED.; ISSN 0019-5200; IND; DA. 1979; VOL. 39; NO 2; PP. 188-193; BIBL. 22 REF.Article
A NOVEL BI-LAYER SYSTEM FOR HIGH RESOLUTION OPTICAL IMAGINGBHANWAR SINGH; CHOPRA KL.1981; PHYSICA STATUS SOLIDI. (A). APPLIED RESEARCH; ISSN 0031-8965; DDR; DA. 1981; VOL. 68; NO 1; PP. K5-K9; H.T. 1; BIBL. 14 REF.Article
PHOTOINDUCED CHEMICAL CHANGES IN OBLIQUELY DEPOSITED AMORPHOUS SE-GE FILMSBHANWAR SINGH; RAJAGOPALAN S; CHOPRA KL et al.1980; J. APPL. PHYS.; ISSN 0021-8979; USA; DA. 1980; VOL. 51; NO 3; PP. 1768-1772; BIBL. 26 REF.Article
Plasma etch process characterization : an application of atomic force microscopyWENGE YANG; BHANWAR SINGH.SPIE proceedings series. 1998, pp 30-40, isbn 0-8194-2777-2Conference Paper
Challenges in process integration and device technology (Santa Clara, 18-19 September 2000)Burnett, David; Kimura, Shin'ichiro; Bhanwar Singh et al.SPIE proceedings series. 2000, isbn 0-8194-3842-1, IX, 344 p, isbn 0-8194-3842-1Conference Proceedings
Metrology, inspection, and process control for microlithography XII (Santa Clara CA, 23-25 February 1998)Bhanwar Singh.SPIE proceedings series. 1998, isbn 0-8194-2777-2, XV, 744 p, isbn 0-8194-2777-2Conference Proceedings
PHOTO-INDUCED OPTICAL EFFECTS IN OBLIQUELY DEPOSITED AMORPHOUS SE-GE FILMSRAJAGOPALAN S; BHANWAR SINGH; BHAT PK et al.1979; J. APPL. PHYS.; USA; DA. 1979; VOL. 50; NO 1; PP. 489-492; BIBL. 15 REF.Article
Optical metrology roadmap for the semiconductor, optical, and data storage industries (San Diego CA, 30-31 July 2000)Al-Jumaily, Ghanim A; Duparré, Angela; Bhanwar Singh et al.SPIE proceedings series. 2000, isbn 0-8194-3744-1, IX, 328 p, isbn 0-8194-3744-1Conference Proceedings
Some issues in SEM-based metrologyJOY, D. C.SPIE proceedings series. 1998, pp 102-109, isbn 0-8194-2777-2Conference Paper
Accuracy and traceability in dimensional measurementsPOTZICK, J.SPIE proceedings series. 1998, pp 471-473, isbn 0-8194-2777-2Conference Paper
Measurement of contamination rate and stage drift in Scanning Electron MicroscopesVLADAR, A. E.SPIE proceedings series. 1998, pp 192-198, isbn 0-8194-2777-2Conference Paper
New method of correlating product wafers' yield to the alignment performance and an optimized accounting method for product wafers' alignmentHAO ZHOU.SPIE proceedings series. 1998, pp 164-172, isbn 0-8194-2777-2Conference Paper
Novel electrical alignment structureLUKANC, Todd.SPIE proceedings series. 2000, pp 107-112, isbn 0-8194-3842-1Conference Paper
Efficient resist edgebead removal for thick I-line resist coating application on TEL Mark 7 track systemQUANG TRAN.SPIE proceedings series. 2000, pp 265-270, isbn 0-8194-3842-1Conference Paper
High performance vs. low power technology roadmaps : How are they different?WRISTERS, Dirk.SPIE proceedings series. 2000, pp 134-139, isbn 0-8194-3842-1Conference Paper
Scaling considerations for MOSFET devices with 25-nm channel lengthsSAHA, Samar.SPIE proceedings series. 2000, pp 210-219, isbn 0-8194-3842-1Conference Paper
Sub-wavelength optical lithographyTERASAWA, Tsuneo.SPIE proceedings series. 2000, pp 8-16, isbn 0-8194-3842-1Conference Paper
A strategy for faster blind reconstruction of tip geometry for scanned probe microscopyVILLARRUBIA, J. S.SPIE proceedings series. 1998, pp 10-18, isbn 0-8194-2777-2Conference Paper
Automated defect inspection: past, present & futureSANDLAND, P.SPIE proceedings series. 1998, pp 296-308, isbn 0-8194-2777-2Conference Paper
Investigation of various factors' influence on charging effects in linewidth metrologyKO, Y.-U.SPIE proceedings series. 1998, pp 81-93, isbn 0-8194-2777-2Conference Paper
Trace contaminants from photoresist materials by modern spectrometry determinationULIERU, D. G.SPIE proceedings series. 1998, pp 721-726, isbn 0-8194-2777-2Conference Paper
Ultra-low energy imaging for metrologyJOY, D. C.SPIE proceedings series. 1998, pp 42-50, isbn 0-8194-2777-2Conference Paper
Influence of the varyband layer of the amorphous hydrogenated silicon-germanium on the current-volt characteristics of the n+(a-Si :H)-i(a-Si1-xGex :H)-n+(a-Si :H)-structuresKABULOV, R. R.SPIE proceedings series. 2000, pp 300-305, isbn 0-8194-3842-1Conference Paper
Influence of lens aberrations on high resolution imaging on low reflectivity substratesMARTIN, B; ARTHUR, G; WALLACE, C et al.SPIE proceedings series. 1998, pp 372-383, isbn 0-8194-2777-2Conference Paper